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Semiconductor devices. Constant current electromigration test Ingestion-build-156411 Replaces BS 5588-4:1998 and specifies
Semiconductor devices. Constant current electromigration test Ingestion-build-156411 Replaces BS 5588-4:1998 and specifies
$142.00
Description
Replaces BS 5588-4:1998 and specifies pressure differential systems designed to hold back smoke at a leaky physical barrier in a building
The protocol specific definitions are based on FF-Specifications for H1 and HSE protocols
BS 3553 specifies basic symbols for use in flowsheets and other diagrams relating to coal preparation plants
(Note that the categories L1 to L7 include 2-
EV manufacturers
Semiconductor devices. Constant current electromigration test Ingestion-build-156411 Replaces BS 5588-4:1998 and specifies1 Scope This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
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